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Author:
Alexander Hauck
License:
MIT License Copyright (c) 2024 Alexander Hauck Permission is hereby granted, free of charge, to any person obtaining a copy of this software and associated documentation files (the "Software"), to d...
Summary:
Framework to analyze properties of radiation-induced defects in semiconductor materials from first principles.
Latest version:
1.6.2
Required dependencies:
doped
|
fpdf
|
importlib-metadata
|
matplotlib
|
monty
|
mp-api
|
niet
|
nonrad
|
numpy
|
pandas
|
plotly
|
pydefect
|
pymatgen
|
pymatgen-analysis-defects
|
pymupdf
|
pypdf
|
requests
|
sumo
|
vise
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